22 Sept. | ![]() |
16:00 - 17:30 |
TT.XII - Technical Multi-Track with Parallel SYMPOSIA | |||||||
Advances in nanomaterials synthesis and nano characterization - part II | |||||||
Co-organized with Sapienza University of Rome Chair: Paolo POSTORINO, Sapienza University of Rome |
|||||||
The symposium 'Advances in nanomaterials synthesis and nano characterization' is divided in two sessions dedicated to the application of advanced methods for materials synthesis and their related characterization using both standard and innovative setups. These sections bring together with a series of presentations that underscore fundamental and practical research in the field of functional materials. This research spans from low-dimensional compounds, such as graphene and transition metal dichalcogenides, to nanostructured materials such as nanoparticles and epitaxial thin film samples. In several cases, the use of cutting-edge computational approaches, such as Density Functional Theory (DFT), for interpreting spectroscopic data provides a deeper understanding of the microscopic interaction mechanisms within the studied materials.
The significance of isotropic compression, as well as more general strain conditions, has been explored using high spatial resolution spectroscopic techniques that cover a range from micrometric to nanometric scales. Electronic and optoelectronic properties, along with methods of modulating them, often take center stage in the presentations. |
|||||||
TT.XII.C.1 |
Gabriele CALABRESE IMM-CNR, Bologna Effect of the molecular self-assembly under confinement on the thermoelectric properties of thin films |
![]() |
![]() |
||||
TT.XII.C.2 |
Flavio COGNIGNI Sapienza University of Rome Leveraging Correlative Microscopy for Failure Analysis in Electronics and Semiconductors |
![]() |
![]() |
||||
TT.XII.C.3 |
Tommaso A. SALAMONE Sapienza University of Rome Nanostructured polymer/AuNPs blends for optoelectronics |
![]() |
![]() |
||||
TT.XII.C.4 |
Giancarlo LA PENNA - CV Sapienza University of Rome Strain characterization in SiGe epitaxial samples by Tip Enhanced Raman Spectroscopy |
![]() |
![]() |
||||
![]() |
Back to Fields & Topics | Back to Plan 22 September | ![]() |